Anti-patterns as a Means of Focusing on Critical Quality Aspects in Enterprise Modeling
2009 (English)In: Enterprise, Business-Process and Information Systems Modeling: 10th International Workshop, BPMDS 2009, and 14th International Conference, EMMSAD 2009, held at CAiSE 2009, Amsterdam, The Netherlands, June 8-9, 2009. Proceedings / [ed] Terry Halpin, John Krogstie, Selmin Nurcan, Erik Proper, Rainer Schmidt, Pnina Soffer, Roland Ukor, Springer Berlin/Heidelberg, 2009, p. 407-418Conference paper, Published paper (Refereed)
Abstract [en]
Enterprise Modeling (EM) is used for a wide range of purposes such as developing business strategies, business process restructuring, business process orientation and standardization, eliciting information system requirements, capturing best practices, etc. A common challenge impeding the value and impact of EM is insufficient model quality. Despite substantial attention from both researchers and commercial vendors of methods the current situation in practice with respect to the quality of models produced is not satisfactory. Many modeling projects produce bad models that are essentially useless. The objective of this paper is to introduce a format, anti-patterns, for documenting critical don'ts in EM and to demonstrate the potential of the format by using it to report a set of common and reoccurring pitfalls of real life EM projects. We use the format of anti-pattern for capturing the bad solutions to reoccurring problems and then explain what led to choosing the bad solution. The anti-patterns in this paper address three main aspects of EM - the modeling product, the modeling process, and the modeling tool support.
Place, publisher, year, edition, pages
Springer Berlin/Heidelberg, 2009. p. 407-418
Series
Lecture Notes in Business Information Processing LNBIP, ISSN 1865-1348 ; 29
Keywords [en]
Enterprise modeling, model quality, anti-patterns
National Category
Computer and Information Sciences
Research subject
Technology
Identifiers
URN: urn:nbn:se:his:diva-3245DOI: 10.1007/978-3-642-01862-6_33ISI: 000268581700033Scopus ID: 2-s2.0-67449105206ISBN: 978-3-642-01861-9 ISBN: 978-3-642-01862-6 OAI: oai:DiVA.org:his-3245DiVA, id: diva2:226145
Conference
10th International Workshop, BPMDS 2009, and 14th International Conference, EMMSAD 2009, held at CAiSE 2009, Amsterdam, The Netherlands, June 8-9, 2009
2009-06-302009-06-302018-01-13Bibliographically approved