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Theoretical investigation of soft x-ray emission from a Si(100) layer buried in GaAs
Department of Physics, Chalmers University of Technology, Göteborg, Sweden.
Department of Physics, Chalmers University of Technology, Göteborg, Sweden.
Department of Physics, Chalmers University of Technology, Göteborg, Sweden.
University of Skövde, Department of Natural Sciences.ORCID iD: 0000-0002-7023-4043
1998 (English)In: Vacuum, ISSN 0042-207X, E-ISSN 1879-2715, Vol. 49, no 3, p. 181-184Article in journal (Refereed) Published
Abstract [en]

Calculations of the soft x-ray emission spectrum have been carried out on a buried Si(100) layer in GaAs and compared with experimental data. We find that Si occupies Ga- as well as As-sites and that the local density of states is different for these two cases.

Place, publisher, year, edition, pages
Elsevier, 1998. Vol. 49, no 3, p. 181-184
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:his:diva-22281DOI: 10.1016/s0042-207x(97)00175-9ISI: 000072918100006Scopus ID: 2-s2.0-0032010418OAI: oai:DiVA.org:his-22281DiVA, id: diva2:1737585
Conference
2nd Swedish Vacuum Meeting (SVM 2), Linköping University, Sweden, August 18-20, 1997
Available from: 2023-02-17 Created: 2023-02-17 Last updated: 2023-02-17Bibliographically approved

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Karlsson, Krister

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